Thickness and density determination of ultrathin solid...

Review of Scientific Instruments 1992 Vol. 63; Iss. 1

Thickness and density determination of ultrathin solid films comprising multilayer x‐ray mirrors by x‐ray reflection and fluorescence study

Zheludeva, S. I., Kovalchuk, M. V., Novikova, N. N., Bashelhanov, I. V., Salaschenko, N. N., Akhsakhalyan, A. D., Platonov, Yu. Ya.
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Volume:
63
Year:
1992
Language:
english
DOI:
10.1063/1.1143010
File:
PDF, 775 KB
english, 1992
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