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[IEEE 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - Enschede, The Netherlands (8-11 October 1996)] Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - Method for precise determination of the statistical distribution of the input offset voltage of differential stages
Thewes, R., Schindhelm, T., Tiebout, M., Wohlrab, F., Kollmer, U., Kessel, S., Schmitt-Landsiedel, D., Weber, W.Year:
1996
Language:
english
DOI:
10.1109/esref.1996.888224
File:
PDF, 393 KB
english, 1996