[IEEE 2011 IEEE International Reliability Physics Symposium...

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[IEEE 2011 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2011.04.10-2011.04.14)] 2011 International Reliability Physics Symposium - Analysis of multiple cell upsets due to neutrons in SRAMs for a Deep-N-well process

Mahatme, Nihaar, Bhuva, Bharat, Fang, Y-P, Oates, Anthony
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Year:
2011
Language:
english
DOI:
10.1109/irps.2011.5784599
File:
PDF, 422 KB
english, 2011
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