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[IEEE 2012 17th IEEE European Test Symposium (ETS) - Annecy, France (2012.05.28-2012.05.31)] 2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) - Bandwidth-aware test compression logic for SoC designs
Janicki, Jakub, Tyszer, Jerzy, Mrugalski, Grzegorz, Rajski, JanuszYear:
2012
Language:
english
DOI:
10.1109/ets.2012.6233003
File:
PDF, 874 KB
english, 2012