[IEEE 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. - Cannes, France (10-13 Oct. 2004)] 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. - Compression of VLSI test data by arithmetic coding
Hashempour, H., Lombardi, F.Year:
2004
Language:
english
DOI:
10.1109/dftvs.2004.1347835
File:
PDF, 326 KB
english, 2004