Few-layer graphene under high pressure: Raman and X-ray...

Solid State Communications 2013 / 1 Vol. 154

Few-layer graphene under high pressure: Raman and X-ray diffraction studies

Clark, S.M., Jeon, Ki-Joon, Chen, Jing-Yin, Yoo, Choong-Shik
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Volume:
154
Language:
english
Journal:
Solid State Communications
DOI:
10.1016/j.ssc.2012.10.002
Date:
January, 2013
File:
PDF, 735 KB
english, 2013
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