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An Area-Efficient 65 nm Radiation-Hard Dual-Modular Flip-Flop to Avoid Multiple Cell Upsets
Yamamoto, Ryosuke, Hamanaka, Chikara, Furuta, Jun, Kobayashi, Kazutoshi, Onodera, HidetoshiVolume:
58
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2011.2169457
Date:
December, 2011
File:
PDF, 1014 KB
english, 2011