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[IEEE Design, Automation & Test in Europe Conference - Nice, France (2007.04.16-2007.04.20)] 2007 Design, Automation & Test in Europe Conference & Exhibition - Joint Consideration of Fault-Tolerance, Energy-Efficiency and Performance in On-Chip Networks
Ejlali, Alireza, Al-Hashimi, Bashir M., Rosinger, Paul, Miremadi, Seyed GhassemYear:
2007
Language:
english
DOI:
10.1109/date.2007.364538
File:
PDF, 244 KB
english, 2007