[IEEE 2006 IEEE International Symposium on Industrial Electronics - Montreal, Que. (2006.07.9-2006.07.13)] 2006 IEEE International Symposium on Industrial Electronics - Switching Loss Analysis and Modeling of Power Semiconductor Devices Base on an Automatic Measurement System
Shen, Yanqun, Xiong, Yan, Jiang, Jian, Deng, Yan, He, Xiangning, Zeng, ZhaohuiYear:
2006
Language:
english
DOI:
10.1109/isie.2006.295746
File:
PDF, 5.63 MB
english, 2006