Threshold voltage asymmetric degradation on octagonal...

Electronics Letters 2012 Vol. 48; Iss. 14

Threshold voltage asymmetric degradation on octagonal MOSFET during HCI stress

Joly, Y., Lopez, L., Portal, J.-M., Aziza, H., Masson, P., Ogier, J.-L., Bert, Y., Julien, F., Fornara, P.
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Volume:
48
Year:
2012
Language:
english
Journal:
Electronics Letters
DOI:
10.1049/el.2012.1162
File:
PDF, 335 KB
english, 2012
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