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[IEEE 2011 IEEE International Conference on Computer Applications and Industrial Electronics (ICCAIE) - Penang, Malaysia (2011.12.4-2011.12.7)] 2011 IEEE International Conference on Computer Applications and Industrial Electronics (ICCAIE) - Comparative statistical-based and color-related pan sharpening algorithms for ASTER and RADARSAT SAR satellite data
Rokni, Komeil, Marghany, Maged, Hashim, Mazlan, Hazini, SharifehYear:
2011
Language:
english
DOI:
10.1109/iccaie.2011.6162208
File:
PDF, 585 KB
english, 2011