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[IEEE International Electron Devices Meeting. Technical Digest. IEDM - San Francisco, CA, USA (10-13 Dec. 2000)] International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) - High performance 0.25-um CMOS color imager technology with non-silicide source/drain pixel
Shou-Gwo Wuu,, Dun-Nian Yaung,, Chien-Hsien Tseng,, Ho-Ching Chien,, Wang, C.S., Yean-Kuen Hsiao,, Chin-Kung Chang,, Chang, B.J.Year:
2000
Language:
english
DOI:
10.1109/iedm.2000.904416
File:
PDF, 367 KB
english, 2000