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Dielectric behavior of bilayer films of P(VDF-CTFE) and low temperature PECVD fabricated Si3N4
Xin Zhou, Qin Chen, Zhang, Q.M., Shihai ZhangVolume:
18
Year:
2011
Language:
english
DOI:
10.1109/tdei.2011.5739450
File:
PDF, 1.79 MB
english, 2011