Impact of Circuit Placement on Single Event Transients in...

IEEE Transactions on Nuclear Science 2012 / 12 Vol. 59; Iss. 6

Impact of Circuit Placement on Single Event Transients in 65 nm Bulk CMOS Technology

He Yibai,, Chen Shuming,, Chen Jianjun,, Chi Yaqing,, Liang Bin,, Liu Biwei,, Qin Junrui,, Du Yankang,, Huang Pengcheng,
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
59
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2012.2218256
Date:
December, 2012
File:
PDF, 806 KB
english, 2012
Conversion to is in progress
Conversion to is failed