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[IEEE 2012 IEEE 21st International Symposium on Industrial Electronics (ISIE) - Hangzhou, China (2012.05.28-2012.05.31)] 2012 IEEE International Symposium on Industrial Electronics - Application of NARX based FFNN, SVR and ANN Fitting models for long term industrial load forecasting and their comparison
Awan, Shahid M., Khan, Zubair. A., Aslam, M., Mahmood, Waqar, Ahsan, AffanYear:
2012
Language:
english
DOI:
10.1109/isie.2012.6237191
File:
PDF, 748 KB
english, 2012