Use of image analysis in DC inclined plane tracking tests...

IEEE Transactions on Dielectrics and Electrical Insulation 2011 Vol. 18; Iss. 2

Use of image analysis in DC inclined plane tracking tests of nano and micro composites

Rowland, S.M., Bruce, G.P., Yuting Liu, Krivda, A., Schmidt, L.E.
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Volume:
18
Year:
2011
Language:
english
DOI:
10.1109/tdei.2011.5739439
File:
PDF, 5.65 MB
english, 2011
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