A Compact Model for Single Event Effects in PD SOI...

IEEE Transactions on Nuclear Science 2012 / 08 Vol. 59; Iss. 4

A Compact Model for Single Event Effects in PD SOI Sub-Micron MOSFETs

Alvarado, Joaquín, Kilchytska, Valeriya, Boufouss, Elhafed, Soto-Cruz, Blanca Susana, Flandre, Denis
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Volume:
59
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2012.2201957
Date:
August, 2012
File:
PDF, 1.38 MB
english, 2012
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