[IEEE 2012 IEEE Radiation Effects Data Workshop (in conjunction with NSREC 2012) - Miami, FL, USA (2012.07.16-2012.07.20)] 2012 IEEE Radiation Effects Data Workshop - Compendium of Single-Event Latchup and Total Ionizing Dose Test Results of Commercial Analog to Digital Converters
Irom, Farokh, Agarwal, Shri G.Year:
2012
Language:
english
DOI:
10.1109/redw.2012.6353729
File:
PDF, 589 KB
english, 2012