[IEEE 2012 IEEE/MTT-S International Microwave Symposium - MTT 2012 - Montreal, QC, Canada (2012.06.17-2012.06.22)] 2012 IEEE/MTT-S International Microwave Symposium Digest - Dynamic measurement of complex impedance in real-time for smart handset applications
Ali, Shirook, Buckley, Michael, Deforge, John, Warden, JamesYear:
2012
Language:
english
DOI:
10.1109/mwsym.2012.6258406
File:
PDF, 525 KB
english, 2012