[IEEE IC's (ISPSD) - Orlando, FL, USA (2008.05.18-2008.05.22)] 2008 20th International Symposium on Power Semiconductor Devices and IC's - Surge Current Ruggedness of Silicon Carbide Schottky- and Merged-PiN-Schottky Diodes
Heinze, Birk, Lutz, Josef, Neumeister, Matthias, Rupp, Roland, Holz, MatthiasYear:
2008
Language:
english
DOI:
10.1109/ispsd.2008.4538944
File:
PDF, 726 KB
english, 2008