[IEEE 20th IEEE Instrumentation Technology Conference (Cat....

[IEEE 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) - Vail, Colorado, USA (20-22 May 2003)] Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) - A to D converters and look-up tables dimensioning for five-port reflectometer based systems

Rangel de Sousa, F., Huyart, B., Catunda, S.Y.C., Nunes de Lima, R.

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Volume:

Year:

2003

Language:

english

DOI:

10.1109/imtc.2003.1208255

File:

PDF, 289 KB

english, 2003

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