Impact of Strained-Si PMOS Transistors on SRAM Soft Error...

IEEE Transactions on Nuclear Science 2012 / 08 Vol. 59; Iss. 4

Impact of Strained-Si PMOS Transistors on SRAM Soft Error Rates

Mahatme, Nihaar N., Bhuva, Bharat L., Fang, Yi-Pin, Oates, Anthony S.
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Volume:
59
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2012.2188040
Date:
August, 2012
File:
PDF, 639 KB
english, 2012
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