[IEEE Design, Automation & Test in Europe Conference - Nice, France (2007.04.16-2007.04.20)] 2007 Design, Automation & Test in Europe Conference & Exhibition - Circuit-Level Modeling and Detection of Metallic Carbon Nanotube Defects in Carbon Nanotube FETs
Hashempour, Hamidreza, Lombardi, FabrizioYear:
2007
Language:
english
DOI:
10.1109/date.2007.364397
File:
PDF, 155 KB
english, 2007