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Reliability of Repetitively Avalanched Wire-Bonded Low-Voltage Discrete Power Trench n-MOSFETs
Alatise, O., Kennedy, I., Petkos, G., Koh, A.Volume:
11
Year:
2011
Language:
english
DOI:
10.1109/tdmr.2010.2102026
File:
PDF, 848 KB
english, 2011