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SPIE Proceedings [SPIE SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 24 July 1994)] Polarization Analysis and Measurement II - Birefringent characteristics of two new crystalline materials: CeF3 and LaF3
Derks, Michael J., Kopp, Greg A., Goldstein, Dennis H., Chenault, David B.Volume:
2265
Year:
1994
Language:
english
DOI:
10.1117/12.186655
File:
PDF, 160 KB
english, 1994