Effect of Combined Oxygenation and Gettering on Minority Carrier Lifetime in High-Resistivity FZ Silicon
Lozano, M., Ullán, M., Martı́nez, C., Fonseca, L., Rafı́, J. M., Campabadal, F., Cabruja, E., Fleta, C., Key, M., Bermejo, S.Volume:
151
Year:
2004
Language:
english
Journal:
Journal of The Electrochemical Society
DOI:
10.1149/1.1786091
File:
PDF, 828 KB
english, 2004