Strain effects on three-dimensional, two-dimensional, and...

Strain effects on three-dimensional, two-dimensional, and one-dimensional silicon logic devices: Predicting the future of strained silicon

Baykan, Mehmet O., Thompson, Scott E., Nishida, Toshikazu
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Volume:
108
Year:
2010
Language:
english
DOI:
10.1063/1.3488635
File:
PDF, 3.61 MB
english, 2010
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