![](/img/cover-not-exists.png)
Strain effects on three-dimensional, two-dimensional, and one-dimensional silicon logic devices: Predicting the future of strained silicon
Baykan, Mehmet O., Thompson, Scott E., Nishida, ToshikazuVolume:
108
Year:
2010
Language:
english
DOI:
10.1063/1.3488635
File:
PDF, 3.61 MB
english, 2010