Investigation of Low Dose Rate and Bias Conditions on the...

IEEE Transactions on Nuclear Science 2012 / 02 Vol. 59; Iss. 1

Investigation of Low Dose Rate and Bias Conditions on the Total Dose Tolerance of a CMOS Flash-Based FPGA

Rezgui, Sana, Wilcox, Edward P., Lee, Poongyeub, Carts, Martin A., LaBel, Kenneth, Nguyen, Victor, Telecco, Nicola, McCollum, John
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Volume:
59
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2011.2179316
Date:
February, 2012
File:
PDF, 1.97 MB
english, 2012
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