[IEEE 2010 Asia-Pacific International Symposium on Electromagnetic Compatibility - Beijing, China (2010.04.12-2010.04.16)] 2010 Asia-Pacific International Symposium on Electromagnetic Compatibility - Considerations of EMI and EMC in the design of 3D imaging microwave altimeter
Lan Ailan,, Zhang Xiangkun,, Zhang Yunhua,, Yin Honggang,, Jiang Jingshan,Year:
2010
Language:
english
DOI:
10.1109/apemc.2010.5475731
File:
PDF, 646 KB
english, 2010