Gated four-probe measurements on pentacene thin-film...

Journal of Applied Physics 2004 Vol. 96; Iss. 12

Gated four-probe measurements on pentacene thin-film transistors: Contact resistance as a function of gate voltage and temperature

Pesavento, Paul V., Chesterfield, Reid J., Newman, Christopher R., Frisbie, C. Daniel
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Volume:
96
Year:
2004
Language:
english
DOI:
10.1063/1.1806533
File:
PDF, 1.25 MB
english, 2004
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