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[IEEE 1994 IEEE International SOI Conference - Nantucket, MA, USA (3-6 Oct. 1994)] Proceedings. IEEE International SOI Conference - Measurement of SOI MOSFET I-V characteristics without self-heating
Jenkins, K.A., Sun, J.Y.-C., Pelloie, J.-L.Year:
1994
Language:
english
DOI:
10.1109/soi.1994.514276
File:
PDF, 146 KB
english, 1994