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[IEEE 2006 Chinese Control Conference - Harbin, China (2006.08.7-2006.08.11)] 2006 Chinese Control Conference - Blackout Model Based on OPF and its Self-organized Criticality

Mei, Sheng-wei, Yadana,, Weng, Xiao-feng, Xue, An-cheng
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Year:
2006
Language:
english
DOI:
10.1109/chicc.2006.280819
File:
PDF, 6.42 MB
english, 2006
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