New Metrics for the Reliability of Approximate and...

IEEE Transactions on Computers 2013 / 9 Vol. 62; Iss. 9

New Metrics for the Reliability of Approximate and Probabilistic Adders

Jinghang Liang,, Jie Han,, Lombardi, F.
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Volume:
62
Language:
english
Journal:
IEEE Transactions on Computers
DOI:
10.1109/tc.2012.146
Date:
September, 2013
File:
PDF, 936 KB
english, 2013
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