[IEEE 2008 Joint International Conference on Power System Technology and IEEE Power India Conference (POWERCON) - New Delhi, India (2008.10.12-2008.10.15)] 2008 Joint International Conference on Power System Technology and IEEE Power India Conference - Design, Simulation and Comparison of Synthetic Test Circuits for High Voltage Circuit Breakers
Jamnani, J. G., Kanitkar, S. A.Year:
2008
Language:
english
DOI:
10.1109/icpst.2008.4745314
File:
PDF, 1.57 MB
english, 2008