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[IEEE 2012 IEEE 18th International On-Line Testing Symposium (IOLTS 2012) - Sitges, Spain (2012.06.27-2012.06.29)] 2012 IEEE 18th International On-Line Testing Symposium (IOLTS) - Through-silicon-via built-in self-repair for aggressive 3D integration
Nicolaidis, Michael, Pasca, Vladimir, Anghel, LorenaYear:
2012
Language:
english
DOI:
10.1109/iolts.2012.6313847
File:
PDF, 754 KB
english, 2012