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[IEEE 2012 Spring Congress on Engineering and Technology (S-CET) - Xi'an, China (2012.05.27-2012.05.30)] 2012 Spring Congress on Engineering and Technology - A Novel Variation-Aware Interconnection Parasitic Extraction Method for 40nm Technology

Ren, Zheng, Li, Xi, Shi, Yanling, Hu, Shaojian, Zhou, Wei, Chen, Shoumian
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Year:
2012
Language:
english
DOI:
10.1109/scet.2012.6341951
File:
PDF, 674 KB
english, 2012
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