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[IEEE 2011 16th North-East Asia Symposium on Nano, Information Technology and Reliability (NASNIT) - Macao, China (2011.10.24-2011.10.26)] The 16th North-East Asia Symposium on Nano, Information Technology and Reliability - FGTMR - Fine grain redundancy method for reconfigurable architectures under high failure rates
Niknahad, Mahtab, Sander, Oliver, Becker, JuergenYear:
2011
Language:
english
DOI:
10.1109/nasnit.2011.6111144
File:
PDF, 844 KB
english, 2011