[IEEE 2001 IEEE MTT-S International Microwave Symposium Digest - Phoenix, AZ, USA (20-25 May 2001)] 2001 IEEE MTT-S International Microwave Sympsoium Digest (Cat. No.01CH37157) - Lifetime characterization of capacitive RF MEMS switches
Goldsmith, C., Ehmke, J., Malczewski, A., Pillans, B., Eshelman, S., Yao, Z., Brank, J., Eberly, M.Volume:
1
Year:
2001
Language:
english
DOI:
10.1109/mwsym.2001.966876
File:
PDF, 453 KB
english, 2001