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Hydrogenic impurity levels, dielectric constant, and Coulomb charging effects in silicon crystallites
Allan, G., Delerue, C., Lannoo, M., Martin, E.Volume:
52
Language:
english
Journal:
Physical Review B
DOI:
10.1103/physrevb.52.11982
Date:
October, 1995
File:
PDF, 332 KB
english, 1995