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[IEEE 2012 IEEE 27th Convention of Electrical & Electronics Engineers in Israel (IEEEI 2012) - Eilat, Israel (2012.11.14-2012.11.17)] 2012 IEEE 27th Convention of Electrical and Electronics Engineers in Israel - Substantiation of sequential test parameters for mass-produced electronic devices
Michlin, Y. H., Shaham, O., Lumelskii, Ya. P.Year:
2012
Language:
english
DOI:
10.1109/eeei.2012.6376986
File:
PDF, 775 KB
english, 2012