Comparison of Combinational and Sequential Error Rates for...

IEEE Transactions on Nuclear Science 2011 / 12 Vol. 58; Iss. 6

Comparison of Combinational and Sequential Error Rates for a Deep Submicron Process

Mahatme, N. N., Jagannathan, S., Loveless, T. D., Massengill, L. W., Bhuva, B. L., Wen, S.-J., Wong, R.
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Volume:
58
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2011.2171993
Date:
December, 2011
File:
PDF, 588 KB
english, 2011
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