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[IEEE 2010 IEEE 16th International On-Line Testing Symposium (IOLTS 2010) - Corfu, Greece (2010.07.5-2010.07.7)] 2010 IEEE 16th International On-Line Testing Symposium - Robust FSMs for cryptographic devices resilient to strong fault injection attacks
Wang, Zhen, Karpovsky, MarkYear:
2010
Language:
english
DOI:
10.1109/iolts.2010.5560195
File:
PDF, 299 KB
english, 2010