[IEEE 2005 IEEE International Conference on Multimedia and Expo - Amsterdam, The Netherlands (06-06 July 2005)] 2005 IEEE International Conference on Multimedia and Expo - Correlation-Based Model of Color Picture Watermarking against Random Geometric Distortion
Echizen, I., Fujii, Y., Yamada, T., Tezuka, S., Yoshiura, H.Year:
2005
Language:
english
DOI:
10.1109/icme.2005.1521398
File:
PDF, 296 KB
english, 2005