[IEEE 2011 IEEE VLSI Test Symposium (VTS) - Dana Point, CA, USA (2011.05.1-2011.05.5)] 29th VLSI Test Symposium - Structural tests of slave clock gating in low-power flip-flop
Wang, Baosheng, Rajaraman, Jayalakshmi, Sobti, Kanwaldeep, Losli, Derrick, Rearick, JeffYear:
2011
Language:
english
DOI:
10.1109/vts.2011.5783730
File:
PDF, 1.59 MB
english, 2011