SPIE Proceedings [SPIE Optical Systems Design - St. Etienne, France (Tuesday 30 September 2003)] Advances in Optical Thin Films - Correlation between laser-induced-damage and nanosized absorbing defects
Bertussi, Bertrand, Natoli, Jean-Yves, During, Annelise, Commandre, Mireille, Gallais, Laurent, Rullier, Jean Luc, Bercegol, Herve, Bouchut, Philippe, Amra, Claude, Kaiser, Norbert, Macleod, H. AngusVolume:
5250
Year:
2004
Language:
english
DOI:
10.1117/12.513373
File:
PDF, 170 KB
english, 2004