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Anatomy of an in-flight anomaly: investigation of proton-induced SEE test results for stacked IBM DRAMs
LaBel, K.A., Marshall, P.W., Barth, J.L., Katz, R.B., Reed, R.A., Leidecker, H.W., Kim, H.S., Marshall, C.J.Volume:
45
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.736545
Date:
January, 1998
File:
PDF, 763 KB
english, 1998