Luminescence and EPR studies of defects in Si-SiO 2 films
Baran, M., Bulakh, B., Korsunska, N., Khomenkova, L., Jedrzejewski, J.Volume:
27
Language:
english
Journal:
The European Physical Journal Applied Physics
DOI:
10.1051/epjap:2004089
Date:
July, 2004
File:
PDF, 103 KB
english, 2004