[IEEE 2010 IEEE International Conference of Electron...

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[IEEE 2010 IEEE International Conference of Electron Devices and Solid- State Circuits (EDSSC) - Hong Kong (2010.12.15-2010.12.17)] 2010 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC) - RF parameter extraction of Bulk FinFET: A non quasi static approach

Kundu, Atanu, Syamal, Binit, Koley, Kalyan, Sarkar, C K, Mohankumar, N
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Year:
2010
Language:
english
DOI:
10.1109/edssc.2010.5713679
File:
PDF, 970 KB
english, 2010
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