High Resolution TEM and Electron Diffraction Study of...

High Resolution TEM and Electron Diffraction Study of Graphene Layers

Suh, Y, Park, S, Kim, M
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Volume:
15
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609098808
Date:
July, 2009
File:
PDF, 2.26 MB
english, 2009
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