[ECS 214th ECS Meeting - Honolulu, HI (October 12 - October 17, 2008)] ECS Transactions - Fabrication and Characterization of High Resistivity SOI Wafers for RF Applications
Lederer, Dimitri C., Roda Neve, Cesar, Olbrechts, Benoit, Raskin, Jean-PierreVolume:
16
Year:
2008
Language:
english
DOI:
10.1149/1.2982866
File:
PDF, 1.02 MB
english, 2008